Potential Stable Low-Permeation Rate Standard Based on Micro-machined Silicon
نویسندگان
چکیده
منابع مشابه
Potential Stable Low-Permeation Rate Standard Based on Micro-machined Silicon
Silicon wafers with micro-machined holes were evaluated for use as low-permeation-rate standard artifacts. Accuracy, stability, and reliability were assessed. Two independent experimental techniques for evaluating permeation were used: chilled mirror hygrometer and mass loss. The wafers exhibited a well-defined linear relationship between hole area and resultant water partial pressure for both ...
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ژورنال
عنوان ژورنال: Journal of Research of the National Institute of Standards and Technology
سال: 2015
ISSN: 2165-7254
DOI: 10.6028/jres.120.021